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Keywords: Master thesis: Dynamic Reliability Assessment of GaN transistors (f/m/div),
Location: München, Bayern
Page: 1
Master thesis: Dynamic Reliability Assessment of GaN transistors (f/m/div)
methods for GaNreliability using fast wafer level reliability (fWLR) methodology. Apply your knowledge of semiconductor... physics and programming skills to advance the field and gain hands-on experience with state-of-the-art GaNtransistors...