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Keywords: Master thesis: Dynamic Reliability Assessment of GaN transistors (f/m/div), Location: München, Bayern

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Master thesis: Dynamic Reliability Assessment of GaN transistors (f/m/div)

methods for GaN reliability using fast wafer level reliability (fWLR) methodology. Apply your knowledge of semiconductor... physics and programming skills to advance the field and gain hands-on experience with state-of-the-art GaN transistors...

Company: Infineon
Location: München, Bayern
Posted Date: 27 Jun 2025