actions are taken to meet NAND reliability( material assessment flow) product requirements. You will be engaged in developing.... Key Responsibilities : Define NAND Flash reliability test flow to assess the product reliability performance and ensure...
. We are looking for a Post-Fab Wafer Finish (PWF) Engineer to join our Advanced Packaging Technology Development (APTD) team...! Your responsibilities include but are not limited to developing and enabling deployment of processes related to the post-fab wafer finishing...
, and qualifying Micron’s next-generation 170S NAND memory products. Ensuring that these products are reliable and meet the necessary... Optimized Test Coverage: The responsibility of ensuring optimized test coverage on all current and future 170S NAND design...
. We are looking for an Advanced Packaging Equipment Engineer to join our Advanced Packaging Technology Development (APTD) team...! Your responsibilities include but are not limited to developing and optimizing next generation, first of a kind (FOAK) wafer...
. We are looking for an Advanced Packaging Integration Engineer to join our Advanced Packaging Technology Development (APTD) team... performance, cost, manufacturability, quality, reliability and schedule requirements. You will also be required to identify...
. We are looking for an Advanced Packaging Metrology-RDA Engineer to join our Advanced Packaging Technology Development (APTD) team... End Wafer Fab, Assembly/Test Engineering, Product Engineering, and Global Quality, to integrate manufacturing processes...
. We are looking for an Advanced Packaging Die Level Technology Engineer to join our Advanced Packaging Technology Development (APTD) team... technologies to meet performance, cost, manufacturability, quality, reliability and schedule requirements...
to look for sighting that is detected from reliability testing on certain cell marginality. To work closely with cross... marginality are noted. Look into volume reliability data to probe data correlation to look for signals for cell metrics/kill...